Machine-Learning Based Solution to Detect Defects in Semiconductor Manufacturing Process

Client's Challenges: Slow Inspections and Missed Defects

Inspecting wafers by hand was too slow. Workers took hours to look for flaws. Many small defects were missed. Production lines had to stop while wafers were checked. Mistakes slipped through and caused expensive problems later.

The client wanted faster, more accurate inspections to keep quality high and production moving.

Key Challenges:

Manual checks were too slow and unreliable, causing delays, waste, and missed chances to improve.

Intech's Solution: Fast, Smart AI Inspections

INTECH made an AI system that looks at wafer images and spots defects instantly. The AI knows what flaws look like and keeps learning over time.

Now, inspections happen much faster. Staff can see clear results on a simple screen. They can act quickly and keep wafers moving through production without long waits.

Here are the key features:

Implementation process

First, we collected lots of real wafer images with different types of defects. We trained the AI on these pictures so it could recognize flaws.

Then we set up the AI on the client's production line. We tested it with live wafers until it caught defects quickly and accurately. Finally, we trained staff on how to use the new system and trust what it showed.

Here is how we did it: